Equipment

For the surface analysis we use the ultra-high vacuum system with a hemispherical energy analyzer PHOIBOS-150, a source of He (I) / He (II)-radiation and X-ray monochromator, from the German company SPECS. The measurements might be taken using various sources: Ag Lα, Al Kα and Mg Кα, with the energy of 2984.3 eV,  1486.6 eV and 1253.6 eV, respectively. There is ion source that allows to perform layerwise ion beam etching of samples. For the analysis of residual  gases and degradation fragments quadrupole mass spectrometer RGA200 (Stanford Research Systems) is used. This system allows to measure X-Ray, photoelectron, Auger-electron, mass spectra, as well as scattering spectra of slow ions. Error in the determination of the binding energies less than 0.1 eV, the error in the determination of the relative intensities - less than 5%.

We use the spectrometric complex to perform surface analysis of different types of solid samples containing elements from Li to U of 0.1 to 100 atm.%, while getting information on their composition, electronic structure, chemical state and geometric features.  

 

BRUKER RFS/100 - Raman spectrometer, measuring range of vibration frequency shifts 200-10000 cm-1;

BRUKER VERTEX 70/RAM II - IR-, Raman- and Fourier-spectrophotometer; measuring range of vibration frequency shifts 200-10000 cm-1;

 

SHIMADZU FTIR Prestige 21  - IR, FT spectrophotometer; the identification of functional groups and compounds with vibration frequencies 300-4000 cm-1.